Lensless phase imaging microscopy using multiple intensity diffraction patterns obtained under coherent and partially coherent illumination
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Applied Sciences | Free Full-Text | Flaw Detection on a Tilted Particleboard by Use of the Spec-Radiation Method
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Applied Sciences | Free Full-Text | Flaw Detection on a Tilted Particleboard by Use of the Spec-Radiation Method
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Measuring the Phase of an Optical Field from Two Intensity Measurements: Analysis of a Simple Theoretical Model
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Wiarus. (Winona, Minn.) 1895-1919, August 15, 1895, Image 2 « Chronicling America « Library of Congress
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